Sites:
| Area Detector Systems Corporation: Manufacturer of CCD detectors, particularly in the X-ray range. Includes specifications, certification and technical support from Poway, California. | | Axic, Inc.: Manufactures and distributes semiconductor plasma processing equipment and thin film metrology tools for the semiconductor, III-V compound semiconductor, optics, photonics, optoelectronics, nanotechnology and micro electromechanical system (MEMS) industries. Includes product overview, contacts for technical support, worldwide distribution and location map of Santa Clara, California. | | Cybertechnologies USA: Manufacturer of non-contact laser sensor-based measurement systems for industrial applications in Ogdensburg, New York. | | Dacell Co., Ltd.: Manufactures load cell, torque sensor, pressure sensor, torque wrench, LVDT, multi-layer inclinometer and digital indicator in Chung-Buk, Korea. | | Innova Air Tech Instruments A/S: Manufacturing systems for measurements in anaesthetic gas monitoring, fermentation monitoring, tracer gas, photoacoustic, ventilation and thermal comfort. Includes applications, publications, distribution from Ballerup, Denmark. | | Molecular Metrology, Inc.: Designs and manufactures x-ray scattering equipment, including complete instruments for small angle mode and two dimensional detectors. Includes specifications of systems and components, at Northampton, Massachusetts. | | Oxford Microbeams Ltd.: Non-destructive, trace elemental analysis, ion beam analysis using a focused microbeam. Includes applications in tomography and microfabrication, downloads and contacts in England. | | Physical Electronics, Inc.: Surface analysis instrumentation, including: AES, ESCA, TOF-SIMS and D-SIMS based instrumentation. |
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