| 16th Flexible Automation and Intelligent Manufacturing Conference (FAIM 2006): 26 June - 28 June, Limerick, Ireland. Address applications of new technologies and methods to the manufacturing environment, from industrial and academic perspectives. Includes preliminary programme and online registration. |
| 2006 IEEE Region 5 Technical, Professional, and Student Conference: April 2006, San Antonio, TX, USA. For student and professional members of IEEE. Includes programme, speaker information and previous year's conference. |
| 32nd Annual Conference of the IEEE Industrial Electronics Society: 7 November - 10 November, 2006, Paris, IECON'06 focus is industrial applications of electronics including control, robotics, signal processing, computational and artificial intelligence, sensors and actuators, instrumentation electronics, computer networks, internet and multimedia technologies. |
| 37th IEEE Power Electronics Specialists Conference (PESC06): 18 - 22 June, 2006, Jeju, Korea. Research and development of power electronics. Programme, speaker information and registration available. |
| 39th International Symposium on Microelectronics (IMAPS 2006): 8 October - 12 October, 2006, San Diego, CA, USA. Focus on the areas of materials and process, design, system/applications and industry. Includes preliminary programme, speaker information and registration. |
| CleanRooms Shows: event information for cleanroom shows by cleanrooms magazine |
| COST-G6 Conference on Digital Audio Effects (DAFx-00): International meeting of researchers in theoretical and applied digital sound and music signal processing that will be held in Verona, Italy, 7-9 December, 2000. |
| European Conference on Circuit Theory and Design (ECCTD '01): 28 August - 31 August 2001, Espoo, Finland at the Helsinki University of Technology. "Circuit Paradigm in the 21st Century". Includes conference updates and photographs from previous and post events. |
| Gallium-Arsenide Manufacturing Technology: The annual International Gallium-Arsenide (GaAs) Manufacturing Technology Conference |
| IEEE International Behavioral Modeling and Simulation Conference (BMAS): Provides call for papers, programme, and registration information for current year. Includes archive of previous technical programmes, papers and presentations of annual workshops. |
| IEEE International On-Line Testing Symposium (IOLTS): Emphasis on on-line testing in the integration of ICs and the continuous operation of large applications such as wired, cellular and satellite telecommunication. Programme details from 1995 to present. Previous events have been held in France, Greece, Spain and Italy. |
| IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT): Annual symposium for discussions on design, manufacturing, test, reliability and availability that are affected by defects during manufacturing and by faults during system operation. Topics include defect and fault tolerance issues, error detection and recovery, yield and dependability analysis and modelling, testing techniques, yield enhancement techniques, applications and case studies. |
| IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems: An annual workshop for topics in the areas of design, test and diagnosis of microelectronic circuits and systems. |
| IMAPS 2005: 29 September - 20 September, 2005, Koszalin, Poland. Programme includes materials and process, design, and applications. |
| International Forum on Advanced Microsystems for Automotive Applications (AMAA): Celebrated tenth anniversary in April 2006. Topics include safety, powertrain, comfort and networked vehicles. Provides previous year's conference proceedings and programme. |
| International IC Conference and Exhibition: Information on Global Sources sponsored technology shows held in Asia. |
| International IP Security Exhibition and Conference (IIPSEC): 23 January - 25 January, 2007, Warks, UK. Shows cover network security, communications, software and services. Includes call for exhibitors, speakers, and sponsors. |
| International Laser Radar Conference: Held biennially under the auspices of the International Coordination-group for Laser Atmospheric Studies (ICLAS). Features news, list of participants, contacts, and application forms. |
| International Test Conference and Test Week: Conference dedicated to electronic test technology, covering the complete cycle from design verification to failure analysis. Includes programme and speaker information, and history. |
| ISAP2005: The 2005 International Symposium on Antennas and Propagation held August 2005 in Seoul, Korea. Includes programme and photographs. |
| Mixed Design of Integrated Circuits and Systems (MIXDES): 22 June - 24 June 2006, Gdynia, Poland. Held annually in Poland. Forum for the exchange of ideas in practical and theoretical issues related to system design as well as in high-level education of microelectronics and power electronics. Includes programme planning and photographs from past conferences. |
| Nepcon China: Complete range of electronics manufacturing technology including materials, equipment and systems for PCB, parts and assemblies, semi-conductor packaging, production, testing, assembly and design as well as electronic components |
| OECC 2005: The Tenth Opto-Electronics and Communications Conference held July 2005 in Seoul, Korea. Includes programme, photographs and video. |
| ONDM 2003: The 7th IFIP Working Conference on Optical Network Design and Modelling. Budapest, Hungary; 3--5 February 2003. |
| PCB Design Conference East: 25 September - 29 September, 2006, Durham, NC, USA. Meeting and exhibition for PCB design professionals. Includes programme and previous year's conference proceedings. |
| PCB Design Conference West: 25 March - 30 March, 2007, Santa Clara, CA, USA. A meeting and exhibition addressing printed circuit board design related topics. Includes upcoming conference information and previous conference proceedings. |
| SiGe: Materials, Processing and Devices: 29 October - 3 November, 2006, Cancun, Mexico. To present the latest advances in SiGe technology. Forum for reviewing and discussing all material and device related aspects of SiGe and Ge. |
| Signal, Image, Video and Applications Conference Time-table: Provides date and submission deadline time-table for conferences in signal processing, image analyis, video coding and related fields. |
| SPWCC: The Semiconductor Processed Wafer and Wet Cleaning Conference focuses exclusively on the performance and problems with wet processes in the semiconductor chip manufacturing industry. Previous programme and abstracts available. Includes call for registration of interest for following year. |
| Taiwan and China Semiconductor Industry Outlook: Examines the challenges and opportunities presented by the increasing economic integration of the U.S., Taiwan, and China semiconductor industries. Sessions focus on strategic issues including export controls, intellectual property rights, investment, partnerships, and market potential. |
| The 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'06): 4 October - 6 October, 2006, Arlington/Washington DC, USA. Annual symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies. Includes speaker and registration and history. |
| Thermal Investigations of ICs and Systems (THERMINIC): 27 September - 29 September, 2006, Nice, Côte d'Azur, France. Encompasses a series of events to discuss the essential thermal questions of microelectronics microstructures and electronic parts in general. Includes previous and current programme and online registration information. |
| Wireless Java 2003: May 2003, Amsterdam, The Netherlands. Lists expert industry speakers. Theme is wireless Java deployments in Asia, Europe and North America. |
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